Canadian Packaging

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The new model X34 X-ray inspection system from Mettler Toledo can identify very small contaminants in a quicker and more reliable manner

October 25, 2018   Canadian Packaging


Designed to deliver improved detection sensitivity for error-free product inspection, the new model X34 X-ray inspection system from Mettler Toledo can identify very small contaminants in a quicker and more reliable manner, thanks to its advanced advanced software that enables automated product set-up—dramatically decreasing the chance of human error and greatly reducing the number of false rejects. Featuring a 100W Optimum Power generator that automatically maximizes detection sensitivity, the X-34 is a single lane X-ray system designed for the inspection of a wide range of small and medium-sized packaged products—enhanced with an advanced 0.4-mm detector for highly accurate detection of very small contaminants. These technologies ensure that power and contrast levels are optimized for every product. This state-of-the-art X-ray system comes with advanced ContamPlus inspection software that further enhances detection capabilities, helping food manufacturers achieve zero FRR (False Reject Rate) performance for reduced cost-of-ownership and higher OEE (Overall Equipment Effectiveness) scores. The X-34 can be equipped with the Mettler Toledo’s new ProdX advanced data management tool for optimized production efficiency and quality control by storing the images body contamination, which can be viewed remotely. The system also features a highly responsive capacitive touchscreen— allowing users to increase the viewing angle of stored images while maintaining optimal image consistency.


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